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Test Handlers Product List and Ranking from 10 Manufacturers, Suppliers and Companies | IPROS GMS

Last Updated： Aggregation Period:Feb 11, 2026～Mar 10, 2026
This ranking is based on the number of page views on our site.

Test Handlers Manufacturer, Suppliers and Company Rankings

Last Updated： Aggregation Period:Feb 11, 2026～Mar 10, 2026
This ranking is based on the number of page views on our site.

  1. 兼松ＰＷＳ Kanagawa//Industrial Machinery
  2. SYNAX Nagano//Industrial Electrical Equipment
  3. テセック Tokyo//Electronic Components and Semiconductors
  4. 4 上野精機 Fukuoka//Other manufacturing
  5. 5 エム・イーシステム Oita//Industrial Electrical Equipment
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Test Handlers Product ranking

Last Updated： Aggregation Period:Feb 11, 2026～Mar 10, 2026
This ranking is based on the number of page views on our site.

  1. SYNAX Corporation Business Introduction SYNAX
  2. NS Technologies Inc. IC Test Handler NX-1032XS 兼松ＰＷＳ
  3. NS Technologies Inc. IC Test Handler NS-8040SH 兼松ＰＷＳ
  4. 4 IC Test Handler NS-8080SH for Medical Devices 兼松ＰＷＳ
  5. 5 NS Technologies, Inc. IC Test Handler NS-8080MS 兼松ＰＷＳ

Test Handlers Product List

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MEMS Test Handler "ULTRA P"

MEMS Test Handler "ULTRA P"

Ideal for measuring MEMS devices! Also compatible with measurements in temperature environments.

"ULTRA P" is a handler developed for the final testing of MEMS devices such as accelerometers and gyroscopes. By using a unique transport method, it achieves simultaneous measurements of up to 96 sites, enabling low-temperature and high-temperature measurements, as well as 6DOF (3 positions, 3-axis gyroscope) measurements. Additionally, we have prepared a measurement unit called "ULTRA L" that allows for manual measurements for research and development purposes. 【Features】 ■ Simultaneous measurement of many units (up to 96 DUT) ■ High-precision temperature control (within ±1℃) ■ Measurement at 60OF is possible ■ Achieves over 20,000 UPH ■ Magnetic testing (optional) is available *For more details, please refer to the catalog or feel free to contact us.

  • Other measurement, recording and measuring instruments
  • Semiconductor inspection/test equipment
  • Test Handlers

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Film Frame Test Handler '4170-IH'

Film Frame Test Handler '4170-IH'

Improved transport accuracy and load capacity of the measurement table! Compatible with WLCSP, multi-site, and batch contact.

The "4170-IH" is a film frame test handler that tests leadless devices such as QFN and CSP directly on the wafer after dicing. By performing visual position correction (xyzθ) before measurement, accurate position information of the device and optimal probe pin pressure are maintained across all devices on the strip, achieving stable measurements and high-speed indexing. 【Features】 ■ High throughput ■ High load capacity, high thrust table ■ Expanded strip attachment area - Within 260mm in length × 300mm in width (WLCSP within φ300mm) ■ LOT management compatible with barcode/2D code reader ■ Switching between varieties is a simple exchange involving only the measurement socket replacement and screen settings. *The downloadable PDF material is the English version of the catalog. For more details, please refer to the PDF material or feel free to contact us.

  • Other inspection equipment and devices
  • Test Handlers

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Test Handler for Normal, High, and Low Temperatures

Test Handler for Normal, High, and Low Temperatures

A test handler that can perform inspections with an accuracy of ±3°C from low to high temperatures!

The "Test Handler" can perform inspections from low to high temperatures with a temperature accuracy of ±3°C. The loader can be replaced with user-specific trays, sticks, etc. Each measurement unit can also be freely swapped. Unnecessary measurement units can be removed, allowing for immediate measurement flow. 【Features】 ■ Consistent measurement possible at room temperature 23°C, high temperature 150°C, low temperature -40°C, with temperature accuracy of ±3°C ■ The loader can be replaced with user-specific trays, sticks, etc. ■ Each measurement unit can be freely swapped ■ Unnecessary measurement units can be removed, allowing for immediate measurement flow *For more details, please contact us.

  • Other inspection equipment and devices
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NS Technologies Inc. IC Test Handler NX-1032XS

NS Technologies Inc. IC Test Handler NX-1032XS

Flagship model: A handler that thoroughly pursues excellent stability and significant reductions in working time.

NS Technologies offers a premium flagship model equipped with an X-Y pitch opening and closing hand for supply and retrieval, achieving a maximum UPH of 20,000 units. - Easy Setup (Automatic Transport Adjustment Function): The transport adjustment time for the supply/retrieval robot during product setting or product changeover can be reduced from approximately 1 hour to about 10 minutes. - Easy Changeover: The nozzle replacement time can be shortened by approximately 30 minutes. Due to the magnetic fixation, no tools are required, resulting in reduced setup time. *1: Parameter setting work time to reduce jams *2: Compared to conventional models from NS Technologies

  • Semiconductor inspection/test equipment
  • Circuit Board Inspection Equipment
  • Testing Equipment and Devices
  • Test Handlers

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NS Technologies Inc. IC Test Handler NS-8040SH

NS Technologies Inc. IC Test Handler NS-8040SH

Middle-range model: A handler that thoroughly pursues excellent stability and significant reduction in working time.

A mid-range model that balances performance and cost-effectiveness - Easy setup (automatic transport adjustment feature): The transport adjustment time for supply/recovery robots during variety setting or variety switching can be reduced from about 1 hour to approximately 10 minutes. - Easy changeover: The nozzle replacement time can be shortened by about 30 minutes. Due to the magnetic fixation, no tools are required, leading to a reduction in setup time. *1: Time for parameter setting work to reduce jams *2: Compared to conventional models from NS Technology Co.

  • Tester
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High-Temperature Test Handler 'TH233C'

High-Temperature Test Handler 'TH233C'

TO220 series device high temperature measurement inspection equipment

The "TH233C" is a high-temperature test handler for TO220 that is suitable for mass production and can connect to large test boxes. Devices supplied via aluminum or plastic tubes are individually sent to the measurement section after heating, measured in a high-temperature state, and classified into designated tubes based on the results. It has three measurement sections and can connect to various test boxes, and a lead inspection mechanism can be optionally installed. 【Features】 ■ High speed and compact size ■ Mass production type that can connect to large test boxes ■ Three measurement sections, compatible with various test boxes ■ Easy operation via a touch panel ■ Lead inspection mechanism available as an option *For more details, please refer to the PDF document or feel free to contact us.

  • Other inspection equipment and devices
  • Semiconductor inspection/test equipment
  • Automatic sorting machine
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Test Handler "TH285"

Test Handler "TH285"

SOP device measurement inspection equipment. Supports RF measurement! High-speed, compact equipment for SOP, SSOP, and DIP.

The "TH285" is a test handler for SOP, SSOP, and DIP that has up to four measurement sections and can be connected to various test boxes. It individually retrieves ICs supplied by aluminum or plastic magazines, installs one or two at the same time into the measurement socket, and classifies and stores them into designated sticks based on the measurement results. It takes into account miniaturization, simplification of variety changes, simplification of maintenance, and enhancement of optional features. 【Features】 - Mass production type that can connect to large test boxes - Up to four measurement sections, compatible with various test boxes - Easy variety change - Simple operability via touch panel - Lead inspection mechanism available as an option *For more details, please refer to the PDF document or feel free to contact us.

  • Other inspection equipment and devices
  • Semiconductor inspection/test equipment
  • Automatic sorting machine
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Crystal Test Handler (Inspection Classifier)

Crystal Test Handler (Inspection Classifier)

- High-speed processing of classification by frequency inspection and electrical characteristics inspection - Compatibility with various sizes through attachment exchange

■High-speed processing Stable high-speed processing has been achieved through index drive using servo motors and reducers, probe operation via direct motor drive, and direct drive in the sorting section. ■Supports various inspections ■Automatic recovery function from work jams By automatically discharging the disk entry section, the system can recover from work jams without operator intervention, thereby improving operational efficiency.

  • Automatic sorting machine
  • Other semiconductor manufacturing equipment
  • Oscillator
  • Test Handlers

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Multifunction Test Handler TM288P

Multifunction Test Handler TM288P

It is a multifunctional test handler designed for SOPs and similar components! It can accommodate various supply forms!

The TM288P adopts a pick-and-place type indexing conveyor system. It can accommodate measurement positions (up to 8 locations), laser marking, and appearance inspection (top/side/bottom) within the index.

  • 図1.png
  • Other electronic parts
  • Test Handlers

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Semiconductor Gravity Test Handler C8/C9 Series

Semiconductor Gravity Test Handler C8/C9 Series

A device that transports parts to semiconductor inspection equipment. It is a gravity-based transport device. It is capable of performing transport and appearance inspection simultaneously.

To transport parts to semiconductor inspection equipment, throughput is an important selection criterion. CCTECH's C8 and C9 series are gravity-based transport devices and handlers. The C8 series is for transport only, while the C9 series supports both transport and appearance inspection. The appearance inspection uses two cameras to inspect the appearance of semiconductor packages.

  • Tester
  • Semiconductor inspection/test equipment
  • Other semiconductor manufacturing equipment
  • Test Handlers

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Semiconductor manufacturing equipment horizontal transport test handler

Semiconductor manufacturing equipment horizontal transport test handler

It is a device that automatically sorts good products and defective products in the inspection process after IC packaging.

M.E. System Co., Ltd. primarily engages in the design and manufacturing of jigs and tools used in the manufacturing processes of precision equipment, as well as the design and manufacturing of precision manufacturing devices used in the semiconductor back-end process, focusing on precision machining and precision sheet metal processing. The horizontal transport test handler is a device used in the inspection process after IC packaging, connected to a tester, which automatically sorts ICs into good and defective products based on the test result signals from the tester. For more details, please contact us or refer to the catalog.

  • Other semiconductor manufacturing equipment
  • Automatic sorting machine
  • Test Handlers

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Support from inspection to analysis storage 'TR Room Temperature Handler'

Support from inspection to analysis storage 'TR Room Temperature Handler'

A high-speed test handler that performs everything from inspection of supplied devices to classification and storage!

The "TR Room Temperature Handler" performs electrical characteristic testing by connecting a designated tester to devices supplied from a parts feeder and stick at the measurement section, and classifies and stores them into specified sticks based on the measurement results. *For more details, please contact us.*

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SYNAX Corporation Business Introduction

SYNAX Corporation Business Introduction

We deliver products that make life simpler and more comfortable.

SYNAX Corporation is a company that develops and manufactures electronic application machinery primarily for the semiconductor and electronics industries. We offer high-temperature multi-handlers, low-temperature multi-handlers, and custom products. Since our establishment in 1986, we have been providing test handlers for semiconductor manufacturing, contributing to making your lives simpler and more comfortable. 【Business Activities】 ■ Development and manufacturing sales of electronic application machinery for the semiconductor and electronics industries *For more details, please refer to our catalog or feel free to contact us.

  • Company：SYNAX
  • Price：Other
  • Semiconductor inspection/test equipment
  • Test Handlers

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NS Technologies Inc. IC Test Handler NS-8160MS

NS Technologies Inc. IC Test Handler NS-8160MS

High-end model: A handler that thoroughly pursues excellent stability and significant reduction in working hours.

The socket layout kit allows for immediate adjustments to socket pitch and the number of simultaneous measurements. It is a high-end model that balances flexibility and high-speed processing. - Easy Setup (automatic transport adjustment feature for easy handling): The transport adjustment time for supply/recovery robots during variety setting or switching can be reduced from about 1 hour to approximately 10 minutes. - Easy Changeover: The nozzle replacement time can be shortened by about 30 minutes. Due to the magnetic fixation, no tools are required, resulting in reduced setup time. *1: Time for parameter setting work to reduce jams *2: Compared to conventional models from NS Technology Co.

  • Semiconductor inspection/test equipment
  • Tester
  • Test Handlers

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Test handler

Test handler

Settings and adjustments can be made via the touch panel! There are various manufacturing achievements in high-temperature environments and more.

This product is a semiconductor test handler integrated device using contact probes. It retrieves strip-shaped lead frames from the stacker magazine, processes the products into individual pieces with a lead processing device, and tests them using contact probes. The products in the testing section are transported using suction hands, and most of the transportation is numerically controlled by servo motors, allowing for settings and adjustments via a touch panel. Additionally, our company has various manufacturing achievements in high-temperature environments and more. 【Features】 ■ Products are processed into individual pieces by the lead processing device ■ Tested using contact probes ■ Transportation by suction hands ■ Settings and adjustments possible via touch panel ■ Various manufacturing achievements, including in high-temperature environments *For more details, please refer to the PDF materials or feel free to contact us.

  • Contract manufacturing
  • Testing Equipment and Devices
  • Test Handlers

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Small Test Handler "TH281"

Small Test Handler "TH281"

SOP system device high-temperature measurement inspection classification. High throughput, low jam rate, space-saving! Compact device for room temperature/high-temperature measurements.

The 『TH281』 is a compact test handler designed for room temperature/high temperature measurements compatible with devices such as SOP, SSOP, and TSSOP. It features a structure that allows for docking with large test heads and is compatible with various sockets including standard sockets, high-frequency sockets, and flat contacts. Additionally, each component has been modularized to achieve quick changeover between different types. 【Features】 ■ High throughput, low jam rate, space-saving ■ Large-capacity loader and unloader suitable for mass production ■ Structure compatible with docking large test heads ■ Modularized components for quick changeover ■ Compatible with various sockets *For more details, please refer to the PDF materials or feel free to contact us.

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High-Temperature Manual Chip Test Handler

High-Temperature Manual Chip Test Handler

Manual handler capable of high-temperature measurement inspection for chip devices, temperature up to 250℃.

Manual handler capable of measuring chip devices at high temperatures up to 250℃ Place the chip on the table and start Automatically measures and ejects the device Overheating of devices up to 250℃ is possible Contacts are made using probe pins Compatible if supplied contacts are available

  • Other inspection equipment and devices
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  • probe
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Daisota Test Handler "LT-evo"

Daisota Test Handler "LT-evo"

Test, 6-sided appearance inspection, laser marking, taping integrated machine.

The "LT-evo" is a Daisota test handler that boasts world-class speed. It achieves a productivity of 70,000 UPH (70,000 units per hour) and damage-free transport of ultra-small products (0.4mm x 0.2mm) through patented technology, and it also supports six-sided visual inspection. Please feel free to contact us if you have any inquiries. 【Features】 ■ Damage-free transfer (patented technology) ■ Compatible with ultra-small devices (0.4 x 0.2mm) ■ Integrated system for testing, six-sided visual inspection, laser marking, and taping *For more details, please download the PDF or feel free to contact us.

  • Semiconductor inspection/test equipment
  • Test Handlers

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NS Technologies, Inc. IC Test Handler NS-8080MS

NS Technologies, Inc. IC Test Handler NS-8080MS

High-end model: A handler that thoroughly pursues excellent stability and significant reduction in working hours.

The socket layout kit allows for immediate adjustments to socket pitch and the number of simultaneous measurements. It is a high-end model that balances flexibility and high-speed processing. - Easy Setup (automatic adjustment function for easy transport): The transport adjustment time for supply/recovery robots during variety settings or variety changes can be reduced from about 1 hour to approximately 10 minutes. - Easy Changeover: The nozzle replacement time can be shortened by about 30 minutes. Since it is fixed by magnets, no tools are required, resulting in reduced setup time. *1: Parameter setting work time to reduce jams *2: Compared to conventional models from NS Technology Co.

  • Tester
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NS Technologies Co., Ltd. IC Test Handler NS-8080SH

NS Technologies Co., Ltd. IC Test Handler NS-8080SH

Middle Range Model: A handler that thoroughly pursues excellent stability and significant reduction in work time.

A mid-range model that balances performance and cost-effectiveness - Easy setup (automatic transport adjustment feature): The transport adjustment time for supply/recovery robots during variety setting or switching can be reduced from about 1 hour to approximately 10 minutes. - Easy changeover: The nozzle replacement time can be shortened by about 30 minutes. Thanks to magnetic fixation, no tools are required, resulting in reduced setup time. *1: Parameter setting work time to reduce jams *2: Compared to conventional models from NS Technology Co.

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IC Test Handler NS-8080SH for Semiconductor Manufacturing

IC Test Handler NS-8080SH for Semiconductor Manufacturing

A mid-range IC test handler that pursues excellent stability and reduced working time.

In the semiconductor industry, there is always a demand for improved product quality and increased productivity. In particular, in the IC testing process, reducing test time and increasing efficiency are crucial. Delays in test time can lead to delays in product delivery and increased costs. NS Technologies' IC test handler, the NS-8080SH, achieves high-speed operation and contributes to solving challenges in semiconductor manufacturing. 【Usage Scenarios】 - Speeding up the IC testing process - Reducing changeover time for different product types - Reducing nozzle exchange time 【Benefits of Implementation】 - Increased throughput (14,500 units/hour) - Reduced setup time - Improved productivity

  • Tester
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IC Test Handler NS-8080SH for the Telecommunications Industry

IC Test Handler NS-8080SH for the Telecommunications Industry

A mid-range handler that thoroughly pursues excellent stability and reduced working hours.

In the telecommunications industry, especially in the inspection of high-frequency devices, high throughput and reliability are required. As devices become smaller and more high-performance, accurate temperature management and a stable testing environment are essential. The IC test handler NS-8080SH addresses these challenges with high throughput, precise temperature management, and easy setup. 【Usage Scenarios】 - Mass production testing of high-frequency devices - Prototype evaluation in research and development - Sampling inspection in quality control departments 【Benefits of Implementation】 - Increased productivity due to reduced testing time - Improved reliability through a stable testing environment - Enhanced work efficiency due to easy setup

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IC Test Handler NS-8080SH for the Automotive Industry

IC Test Handler NS-8080SH for the Automotive Industry

High-speed, high-precision IC test handler that supports the reliability of automotive components.

In the automotive industry, the quality and reliability of electronic components are crucial factors that influence the overall safety and performance of vehicles. Particularly for electronic components used in harsh environments, durability against temperature changes and vibrations is required. The IC test handler NS-8080SH provides high reliability and an efficient testing process to meet these demands. 【Usage Scenarios】 - Quality inspection of automotive electronic components - Durability testing in high-temperature environments - Support for small-batch production of various types 【Benefits of Implementation】 - Reduced testing time due to high throughput - Provision of a stable testing environment - Improved quality through early detection of defects

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IC Test Handler NS-8080SH for IoT Devices

IC Test Handler NS-8080SH for IoT Devices

A handler that thoroughly pursues excellent stability and reduced working hours.

In the evaluation of IoT device connectivity, it is essential to test a large number of devices quickly and accurately. As the diversity and complexity of devices increase, it is important to achieve both a reduction in testing time and high reliability. The IC test handler NS-8080SH contributes to quality management and improved development efficiency for IoT devices. 【Usage Scenarios】 - Mass production testing of IoT devices - Connectivity evaluation testing - Quality management 【Benefits of Implementation】 - Reduction in testing time - Assurance of high reliability - Increased productivity

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[For AI] IC Test Handler NS-8080SH

[For AI] IC Test Handler NS-8080SH

A mid-range handler that supports the efficiency of IC testing in AI development.

In the field of AI, improving the accuracy and speed of learning models is a critical challenge. Therefore, it is necessary to quickly evaluate the quality of AI chips to facilitate early detection of defects and improve yield. The IC test handler NS-8080SH contributes to shortening the test time for AI chips and accelerating the development cycle. 【Usage Scenarios】 - Mass production testing of AI chips - Chip selection for collecting training data - Prototype evaluation in AI development 【Benefits of Implementation】 - Shortened development period due to reduced test time - Cost reduction through early detection of defects - Stable supply of high-quality AI chips

  • Tester
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IC Test Handler for Industrial Robots NS-8080SH

IC Test Handler for Industrial Robots NS-8080SH

A handler that thoroughly pursues excellent stability and reduced working hours.

As automation utilizing industrial robots advances, IC test handlers are required to have high throughput and stable operation. In particular, to maximize production efficiency, it is important to reduce the time spent on product changeovers and maintenance. NS Technologies' IC test handler NS-8080SH addresses these challenges and contributes to increased productivity. 【Usage Scenarios】 - Factories engaged in mass production of ICs - Production lines with frequent product changeovers - Companies looking to promote labor-saving and automation 【Benefits of Implementation】 - Improved production efficiency through reduced product changeover time - Reduced nozzle replacement time - Increased production volume due to high throughput

  • Tester
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IC Test Handler NS-8080SH for Medical Devices

IC Test Handler NS-8080SH for Medical Devices

A mid-range model that pursues excellent stability and reduced working hours.

In the medical device industry, the quality and reliability of products are of utmost importance. Especially for medical devices that use precise electronic components, accurate testing of ICs is essential. Low testing accuracy can lead to malfunctions or performance degradation of the devices, potentially jeopardizing patient safety. NS Technologies' IC test handler, the NS-8080SH, is equipped with high throughput and temperature management features, contributing to the efficiency and quality improvement of IC testing in medical device manufacturing. 【Usage Scenarios】 - IC testing for medical electronic devices - Sorting of precision electronic components - Inspections in quality control departments 【Benefits of Implementation】 - Reduction in testing time - Early detection of defective products - Improvement in product reliability

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IC Test Handler NS-8080SH for Home Appliances

IC Test Handler NS-8080SH for Home Appliances

Streamlining IC testing for small home appliances while ensuring high quality.

In the home appliance industry, the miniaturization of products is progressing, and along with this, the integration density of IC chips is also increasing. As a result, high precision and efficiency are required in the testing process of IC chips. It is particularly important to test a large number of IC chips quickly and accurately within a limited space. The IC test handler NS-8080SH addresses the challenges of testing ICs for small home appliances and supports the development of high-quality products. 【Usage Scenarios】 - IC testing process for small home appliances - Testing of densely integrated IC chips - Improvement of production efficiency 【Benefits of Implementation】 - Reduction of testing time - Decrease in defective products - Enhanced product reliability

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